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Facilities
| 1.Measurement Equipment 2.Fabrication Equipment 3.for Advanced Process and Analysis 4.Material Characterization & Advanced Analysis |
Professional Equipment at Asia University’s Semiconductor Program
The Semiconductor Bachelor's Degree Program at Asia University is equipped with state-of-the-art laboratory facilities to support IC design, semiconductor fabrication, packaging, and testing. Below is a list of key equipment used in measurement, simulation, fabrication, and material analysis.
Semiconductor Measurement, Simulation, and Testing Equipment
 Digital IC Chip Tester
Used for functional and performance testing of digital integrated circuit chips.
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 Four-Point Probe Measurement System
Measures the resistivity and sheet resistance of thin films and semiconductor materials.
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 Semiconductor Parameter Analyzer (HP 4156A)
Measures semiconductor device parameters, such as current-voltage (I-V) and capacitance-voltage (C-V) characteristics.
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 TCAD Simulation Server (IBM X3850 X6 CentOS 7)
High-performance computing server for semiconductor device and process simulations.
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Semiconductor Fabrication Equipment
 Vacuum Sputtering System
Deposits thin films onto substrates through vacuum-based sputtering.
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 UV Surface Modification System
Uses UV light to modify surface properties, enhancing adhesion and removing organic contaminants.
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 pH Meter
Measures the pH value of aqueous solutions to determine acidity or alkalinity.
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 Conductivity Meter
Measures the electrical conductivity of a solution, indicating ion concentration and purity.
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Planned Equipment Acquisition for Advanced Process and Analysis
 Vacuum Co-Sputtering System
Deposits multiple thin-film layers simultaneously under vacuum conditions.
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 Electrochemical Workstation
Conducts electrochemical testing for batteries, corrosion, and material analysis.
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 Atomic Layer Deposition (ALD) System
Enables precise nanometer-thickness film deposition with uniformity and high-quality surface control.
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 Vacuum High-Temperature Annealing Furnace
Alters material properties by annealing at high temperatures under vacuum conditions.
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Semiconductor Material Characterization & Advanced Analysis
 Surface Profilometer
Measures the surface roughness and profile of materials.
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 UV-Visible Spectrophotometer
Analyzes the optical absorption properties of materials.
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 C-V Measurement System
Evaluates the capacitance-voltage characteristics of semiconductor devices for electrical analysis.
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 Hall Measurement System
Measures carrier concentration and electrical properties of semiconductor materials using the Hall Effect.
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 Optical Microscope
Magnifies and inspects microscopic structures on semiconductor surfaces.
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