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V101 Automated Testing and Integration System

V101 Automated Test and Integration System

System Overview

V101 Automated Test and Integration System Equipment

The V101 Automated Test and Integration System is a highly flexible testing platform applicable to fields such as semiconductor process validation, component analysis, and academic research. It features the following core capabilities:

  • Supports up to 1024 Pin digital signal testing, with speeds reaching 100 MHz.
  • Capable of simultaneous Multi-site testing, supporting up to 64 test sites.
  • Features a modular architecture, allowing the integration of various measurement and control equipment as required.

Key Features and Functions

  • Supports multiple test modes and parameter settings.
  • Equipment Compatibility: Can be integrated with a Probe Station, light source modules, and functional IC measurement equipment.
  • Broad Applicability: Suitable for semiconductor process validation, component analysis, and academic research.

Core Applications

  1. CMOS Image Sensor Test (CIS Test):

    Integrates image acquisition cards, light sources, and image processing computers to perform DC, AC, and functional testing.

  2. Failure Analysis:

    Provides precise drive signals to observe circuit behavior, and can be used with specialized analysis equipment like PICA and EMMI.

  3. Power Device Test:

    Integrates external high-voltage equipment (**GPIB/Ethernet**) to perform voltage output, measurement, and data acquisition.