Semiconductor Parameter Anzlyzer
Semiconductor Parameter Analyzer
Instrument Overview
The HP4145B Semiconductor Parameter Analyzer is a high-precision measurement instrument used for analyzing and evaluating the electrical characteristics of various semiconductor components. It performs I–V (Current–Voltage) and C–V (Capacitance–Voltage) testing, helping researchers gain a comprehensive understanding of device characteristics. It is widely applied in R&D, process validation, and quality control.
🎯 I. Objectives and Applications
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Semiconductor Device I–V and C–V Characterization
Evaluates the fundamental electrical behavior of transistors, diodes, sensing components, and more.
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Threshold Voltage & Subthreshold Slope Analysis
Used for extracting the conduction characteristics and switching efficiency of MOS devices.
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Leakage Current & Breakdown Voltage Testing
Assesses the stability and reliability of devices under high voltage or high-temperature conditions.
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Transistor Parameter Analysis
Includes key characteristics such as Mobility and Transconductance.
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Device Reliability & Quality Control
Applied for new process validation, product yield analysis, and long-term stability testing.
⚙️ II. System Principle
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Bias Application
The analyzer applies precisely controlled voltage or current to the Device Under Test (DUT).
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Signal Measurement
The resulting current or voltage response of the device is measured in real-time and recorded with high accuracy.
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Data Processing
The system automatically generates I–V or C–V curves, which are then used to analyze the device's threshold voltage, conductivity, capacitance change, and other critical semiconductor parameters.
